Electrical Test
Devices are available in die or wafer form or in a variety of standard and custom semiconductor packages. Devices may be tested against manufacturers’ data book limits, customer-specified limits or BS, CECC, MIL or SPACE test methods.
Temperature range for die/wafer 25°C to +200°C
Temperature range for packaged devices –70°C to +200°C
All testing is carried out through our member company TS2 Micro Ltd, please visit their web site at
www.ts2micro.com
for further information.
Product types include the following:
- Analogue Operational Amplifiers
- Comparators
- Voltage Regulators
- Voltage References
- Analogue Switches
- Multiplexers
- Analogue to Digital Convertors
- Power management IC's
- Switched Mode Controllers
- Transistors
- Diodes
- Triacs
- Power HEXFET's
- Discrete functions
- Digital 54 and 74 Logic Series
- CMOS
- Bipolar
- Line Drivers
- Decoders
- Level translators
- Digital to Analogue converters
- Special functions
- Memory PROM programming for die and packaged devices
- ASIC/Custom Test programme development on request
Common Process Routes